Nordson TEST & INSPECTION Showcases Quadra 7 Pro MXI System at SEMICON West 2023

Nordson TEST & INSPECTION Showcases Quadra 7 Pro MXI System at SEMICON West 2023

Nordson TEST & INSPECTION announced that it will exhibit the WaferSense® Auto Teaching SystemTM (ATS2) and highlight the brand-new Quadra 7 Pro Manual X-ray Inspection (MXI) System at SEMICON West. The exceptionally expected Quadra 7 Star will be the discussion of stall 964 during the occasion, which is planned to happen from July 12-14, 2023, at the Moscone Center in San Francisco, California.

For back-end semiconductor applications, the Quadra 7 Pro MXI system sets a new standard for 3D/2D manual inspection with a higher resolution. It is outfitted with cutting-edge Onyx® detector technology, which results in increased image clarity and decreased noise levels, enhancing the inspection experience to previously unheard-of levels of precision and efficiency.

The most recent Dual Mode Quadra NT4® tube in the Quadra 7 Pro gives users the most versatility. Operators can dynamically switch between brightness and resolution modes based on their specific application requirements with this innovative feature.

The Quadra 7 Pro’s cutting-edge hardware is complemented by the brand-new RevaluationTM software. With a user-friendly interface, improved workflow, and expanded functionality, RevalutionTM software enhances the user experience for high-end semiconductor applications. It speeds up decision-making and boosts overall productivity by allowing operators to quickly analyze and interpret inspection data.

CyberSpectrumTM software and the WaferSense® ATS2 multi-camera sensor are used to instruct precise wafer hand-off calibration for the alignment and setup of semiconductor tools. Without having to open the tools, the sensor can “see” inside and capture real-time three-dimensional offset data (x, y, and z) to quickly teach wafer positions. Engineers of process and equipment can speed up troubleshooting and eliminate variation between technicians by carrying out setups and maintenance checks that are repeatable and reproducible. With WaferSense sensors, semiconductor fabs all over the world significantly increase productivity, processes, and yields.

At SEMICON West, stop by booth 964 to get a firsthand look at the Quadra 7 Pro Manual X-ray Inspection system and learn about the future of advanced inspection technology.

Click on the following link Metrologically Speaking to read more such news about the Metrology Industry.

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