Autodesk, Inc. (NASDAQ: ADSK) has completed the acquisition of Pype and its portfolio of cloud-based software solutions for the construction industry. This acquisition and resulting product integrations
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µCMM-Optical CMM machine by Bruker Alicona
The optical μCMM offers high accuracy for the fast measurement of components with tight tolerances. It reproducibly measures matte to highly polished surfaces and is
Rafael uses KITOV ONE for inspection of complex assemblies
Developers and manufacturers in the defense and aerospace industry often describe themselves as suppliers of uncompromising quality for good reason: quality in aerospace and defense
FARO® hires industry veterans
FARO Technologies, Inc. (NASDAQ: FARO), a global leader of 3D measurement, imaging, and realization solutions for the 3D Metrology, AEC (Architecture, Engineering & Construction), and
HIGHLY ACCURATE RAPID MEASUREMENT OF VARIOUS SURFACES
The Werth Chromatic Focus Point sensor is a highly accurate optical distance sensor that is largely insensitive to surface condition.A typical application is determining flatness
M3 Solution Center in Japan or Overseas Opens
New Center Can Offer Proposal-Based Solutions
M3 Solution Center UTSUNOMIYA Begins Operations
Mitutoyo Corporation (headquarters: Takatsu-ku, Kawasaki-shi, Kanagawa, Japan; President: Yoshiaki Numata) constructed a new three-story Solution Building to expand and enhance showroom functions and reinforce the
New Height Gauge Hi_Cal V2 Smart with integrated Bluetooth® technology by SYLVAC
Their new height gauge Hi_Cal V2 Smart is now available and with the famous Sylvac Bluetooth® technology. Your benefits at a glance: • Integrated Bluetooth®
3D Technology in the Sector of Art
The Mutilated Christ of Málaga– a Case Study by SICNOVA 3D “Thanks to the combination of 3d digitizing and the classic procedures of polychrome sculpture,
Mikro Innotech India Pvt. Ltd. – A Journey from Trials to Triumph
Mr. Rajesh Pawar is the promoter and director of Mikro Innotech India Pvt. Ltd. He co-founded Mikro Innotech India Private Limited in 2008. Since then
ZEISS Adds Advanced Reconstruction Intelligence to 3D Non-destructive X-ray Imaging for Improved Semiconductor Package Failure Analysis
New iterative and deep learning reconstruction algorithms significantly enhance throughput and image quality for ZEISS Xradia Versa and Context microCT systems ZEISS today introduced the
