This content was originally written and published by the Mahr Metrology team on their website. Reproduced here from this link.
Flexible all-round measurement solution
The MarSurf CM explorer is a compact confocal microscope with which you can precisely measure and analyze surfaces in three dimensions – contact-free, independent of the material, and quickly.
Flexible all-round measurement solution
Thanks to its robust construction and insensitivity to environmental influences, the MarSurf CM explorer is not only suitable for use in test and inspection laboratories but is also ideally equipped for quality assurance in production environments
Typical measurement tasks
- Roughness measurements according to ISO 4287 & ISO 13565 / ISO 25178
- Topography measurements (including volume, wear, tribology)
- Contour and shape (2D, 3D)
- Pore and particle analysis
- Defect Detection
Maximum data quality
One of our most important criteria, means excellent precision, accuracy, repeatability, reproducibility, and documentation for traceability and auditability. Our greatest achievement for customers is a quantitative metric they can rely on in engineering, product and process design, quality control, etc.
Correct, reproducible measurement
Your measurement data are recorded reliably and repeatably and guarantee the highest raw data quality and profile accuracy.
Wide range of workpieces
Material-independent measurement of any geometries and surface properties, regardless of whether they are reflective, absorbent, opaque, or transparent.
Intuitive handling
Simple, user-guided interface with automatics for all essential measurement parameters, as well as the use of measurement recipes for known surfaces.
Technical Specification
| MarSurf CM explorer | | Item No. 6350000 |
|---|---|
| Measuring speed | up to 100fps |
| resolution | up to 2 (nm) vertically |
| Measuring principle | Confocal high-performance LED (505 nm / white) |
| Languages: | German, English, French, Italian, Spanish, Portuguese, Polish, Russian, Turkish, Chinese, Japanese, Korean |
| miscellaneous | Collision detection in the xyz direction |
| Power supply | 100-240V |
| Characteristic values | ISO 4287, ISO 13565, ISO 25178, … |
| Dimensions |
Applications
Diverse areas of application for MarSurf CM explorer.
Mechanical engineering
qualify and quantify roughness, geometry, and wear volume
Electronics and semiconductors
Component inspection down to the sub-micrometer range for fault-free products
Medical technology
Quality assurance of medical technology surfaces in production and laboratory
Materials science
Optimization of functional properties of new surfaces and products
Microsystem technology
Complex surface geometries of the smallest components are measured with nanometer accuracy
To know more, please check Mahr
