Nordson TEST & INSPECTION announces its participation in SMTAI and SMTA Guadalajara. The Company will showcase its state-of-the-art inspection and metrology solutions including the SQ3000™+ Multi-Function system for AOI, SPI and CMM, as well as the Quadra 7 Pro Manual X-ray Inspection (MXI) system in booth #1301 and #1305. The events will take place at the Minneapolis Convention Center from October 9th – 12th and from Wednesday, October 25th – 26th at the Expo Guadalajara in Mexico.
The SQ3000™+ Multi-Function system is specifically designed for high-end applications including advanced packaging, mini-LED, advanced SMT and 008004/0201 SPI. This all-in-one solution delivers unmatched accuracy and high-speed inspection, incorporating an even higher resolution Multi-Reflection Suppression (MRS®) sensor that effectively eliminates reflection-based distortions caused by shiny components and specular surfaces.
The Quadra 7 Pro MXI system sets a new industry standard for 3D/2D manual inspection in back-end semiconductor applications. Powered by the revolutionary Onyx® detector technology, it offers exceptional image clarity and low noise, elevating the inspection experience to new heights.
Equipped with the latest Dual Mode Quadra NT4® tube, the Quadra 7 Pro provides users with unparalleled flexibility. The innovative tube offers brightness and resolution modes, allowing operators to dynamically switch between them based on specific application requirements, providing optimal results for a wide range of inspection tasks.
The Quadra 7 Pro’s capabilities are further enhanced by the newly developed Revalution™ software tailored for high-end semiconductor applications. Boasting an intuitive interface, optimized workflow, and expanded functionality, Revalution™ software empowers operators to efficiently analyze and interpret inspection data, facilitating faster decision-making and improved overall productivity.
Click on the following link Metrologically Speaking to read more such news about the Metrology Industry.
